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Wyniki 1-1 spośród 1 dla zapytania: authorDesc:"MARCIN W. DUDEK"

» A low-cost impedance measurement technique for thick-film electronic components diagnostics

MARCIN W. DUDEK

KAROL NITSCH

ANDRZEJ DZIEDZIC

Fabrication of thick-film electronic components (resistors, capacitors, varistors) involves a lot of still developing techniques: screen printing, photoforming, direct write printing, liquid ink jet printing, laser trimming etc. Different methods of production result in various electrical properties of fabricated components. Electrical impedance is the main physical parameter that fully characterize alternating current properties of electronic components. The main technique to investigate AC properties is impedance spectroscopy [1]. Full characterization of electrical properties requires wide frequency range measurements which normally need precise and expensive analyzers [2]. Simple and inexpensive Virtual Instrument setup and impedance calculation algorithms that are proposed in this paper ensure that first basic post-process quality check of fabricated thick-film structures can be obtained on place in the technological laboratory without need of high cost precise measuring devices which are always complicated to operate and needs qualified metrological personnel. Principle of measurement Basically, we can describe impedance as a complex number that represents current response for voltage perturbation (and vice-versa). For sinusoidal signal this response is seen as an amplitude change and time delay of response signal (described as an angular part of period) - Fig. 1. Using simple calculations we can transform impedance (dependent on perturbation frequency) to other useful object parameters (admittance Y(ω), complex capacitance C(ω) and electrical modulus M(ω)) as well as material parameters (resistivity ρ(ω), conductivity σ(ω), permittivity ε(ω), and modulus m(ω)) - Fig. 2. Classic techniques of impedance measurement include impedance bridges or resonant bridges. First method can cover frequencies from DC to 300 MHz, second one is suitable only for frequencies higher tha[...] więcej»
w zeszycie ELEKTRONIKA - KONSTRUKCJE, TECHNOLOGIE, ZASTOSOWANIA 2011/3

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